1. Digital system testing and testability design;Abramovici,1990
2. Deterministic tests for detecting scrambled pattern sensitive faults in RAMs;Cockburn;IEEE Int. Workshop on Memory Technology,1995
3. Near optimal tests for classes of a write triggered coupling faults in RAMs;Cockburn;Journal of Electronic Testing,1992
4. Testability features of the MC68060 Microprocessor;Crouch;Proc. of IEEE Int. Test Conf,1994
5. Experimental results for random testing of microprocessors;Fedi;IEEE FTCS-14 Symposium,1984