Author:
Dilillo Luigi,Girard Patrick,Pravossoudovitch Serge,Virazel Arnaud,Borri Simone,Hage-Hassan Magali
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference10 articles.
1. R.D. Adams and E.S. Cooley, “Analysis of a Deceptive Destructive Read Memory Fault Model and Recommended Testing,” Proc. IEEE North Atlantic Test Workshop, 1996.
2. Z. Al-Ars and A.J. van de Goor, “Static and Dynamic Behavior of Memory Cell Array Opens and Shorts in Embedded DRAMs,” Proc. Design, Automation and Test in Europe, 2001, pp. 496–503.
3. S. Borri, M. Hage-Hassan, P. Girard, S. Pravossoudovitch, and A. Virazel, “Defect-Oriented Dynamic Fault Models for Embedded-SRAMs,” Proc. IEEE European Test Workshop, 2003, pp. 23–28.
4. A.J. van de Goor, “Testing Semiconductor Memories: Theory and Practice,” COMTEX Publishing, Gouda, The Netherlands, 1998.
5. A.J. van de Goor and Z. Al-Ars, “Functional Memory Faults: A Formal Notation and a Taxonomy,” Proc. IEEE VLSI Test Symposium, May 2000, pp. 281–289.
Cited by
15 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献