Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/article/10.1007/s10836-018-5724-y/fulltext.html
Reference27 articles.
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2. Andraud M, Stratigopoulos HG, Simeu E (2016) One-shot non-intrusive calibration against process variations for analog/RF circuits. IEEE Trans Circuits Syst Regul Pap 63(11):2022–2035
3. Ayari H, Azais F, Bernard S, Comte M, Kerzerho V, Potin O, Renovell M (2012) Making predictive analog/RF alternate test strategy independent of training set size. In: Proc. IEEE International Test Conference. Paper 10.1
4. Biswas S, Blanton RD (2008) Test compaction for mixed-signal circuits using pass-fail test data. In: IEEE VLSI Test Symposium, pp 299–308
5. Brockman JB, Director SW (1989) Predictive subset testing: Optimizing IC parametric performance testing for quality, cost, and yield. IEEE Trans Semicond Manuf 2(3):104–113
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