One-Shot Non-Intrusive Calibration Against Process Variations for Analog/RF Circuits-Reference-Cited by-同舟云学术

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One-Shot Non-Intrusive Calibration Against Process Variations for Analog/RF Circuits

Published:2016-11 Issue:11 Volume:63 Page:2022-2035
ISSN:1549-8328
Container-title:IEEE Transactions on Circuits and Systems I: Regular Papers
language:
Short-container-title:IEEE Trans. Circuits Syst. I

Author:

Andraud Martin,Stratigopoulos Haralampos-G.,Simeu Emmanuel

Funder

French Research Agency (ANR)

ENIAC JU

CNRS/INSIS

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/8919/7676403/07575666.pdf?arnumber=7575666

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