Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits

Author:

Freijedo Judit F.,Semião Jorge,Rodriguez-Andina Juan J.,Vargas Fabian,Teixeira Isabel C.,Teixeira J. Paulo

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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2. Decoupling GPGPU voltage-frequency scaling for deep-learning applications;Journal of Parallel and Distributed Computing;2022-07

3. Conducted EMI susceptibility analysis of a COTS processor as function of aging;Microelectronics Reliability;2020-11

4. Analysis and Evaluation of PUF-Based SoC Designs for Security Applications;IEEE Transactions on Industrial Electronics;2016-09

5. Fault-Tolerance in Field Programmable Gate Array with Dynamic Voltage and Frequency Scaling;Journal of Low Power Electronics;2015-12-01

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