Towards an EPR on a Chip Spectrometer for Monitoring Radiation Damage During X-ray Absorption Spectroscopy

Abstract

AbstractElectron paramagnetic resonance (EPR) spectroscopy is an essential tool to investigate the effects of ionizing radiation, which is routinely administered for reducing contaminations and waste in food products and cosmetics as well as for sterilization in industry and medicine. In materials research, EPR methods are not only employed as a spectroscopic method of structural investigations, but also have been employed for detection of changes in electronic structure due to radiation damage from high energy X-rays, for example, to monitor radical formation inside biomolecules caused by X-ray irradiation at carbon, nitrogen, and oxygen K-edges at synchrotron facilities. Here a compact EPR spectrometer, based on EPR-on-a-chip (EPRoC) sensor and a portable electromagnet, has been developed as a solution for monitoring radiation damage of samples during their investigation by X-ray absorption spectroscopy (XAS) at synchrotron facilities. A portable electromagnet with a soft iron core and forced air temperature stabilization was constructed as the source of the external magnetic field. The sweep range of magnetic field inside the most homogeneous region of the portable electromagnet is 12–290 mT. The compact spectrometer performance was evaluated by placing the EPRoC sensor inside either a commercial electromagnet or the portable electromagnet to record the EPR spectrum of tempol, irradiated alanine, and dilithium phthalocyanine (Li2Pc). The potential performance of the portable spectrometer for the detection of radiation damage in organic compounds and transition metal-containing catalysts during XAS measurements in both fluorescence and transmission modes was calculated with promising implications for measurements after implementation in a synchrotron-based XAS spectrometer.