Modeling of Moisture Diffusion and Moisture-Induced Stresses in Semiconductor and MEMS Packages

Author:

Jang C.,Han B.

Publisher

Springer US

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Investigating moisture diffusion in Mold Compounds (MCs) for Fan-Out-Wafer-Level-Packaging (FOWLP);2022 IEEE 72nd Electronic Components and Technology Conference (ECTC);2022-05

2. Investigation of Moisture-Induced Warpage of Chip-on-Wafer in 2.5D IC Package;2022 IEEE 72nd Electronic Components and Technology Conference (ECTC);2022-05

3. Coupled Hygro-Thermo-Mechanical Analysis of Moisture Induced Interfacial Stresses in Fan-Out Package;2019 14th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT);2019-10

4. Moisture Ingress, Behavior, and Prediction Inside Semiconductor Packaging: A Review;Journal of Electronic Packaging;2017-01-16

5. Modeling of moisture-induced stress in PMMA: A simple approach to consider sorption behavior in FEM;Polymer Engineering & Science;2016-06-27

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