Characterization of multilayer-interfaces by X-ray diffraction, TEM, SNMS and AES

Author:

Hopfe S.,Kallis N.,Mai H.,Pompe W.,Scholz R.,V�llmar S.,Wehner B.,Wei�brot P.

Publisher

Springer Science and Business Media LLC

Subject

Biochemistry,Analytical Chemistry,Biochemistry

Reference15 articles.

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2. Spiller E (1987) In: Dhez P, Weisbuch C (eds) Multilayer Optics for X-rays. NATO ASI Series B, Physics, vol 182. Plenum Press, pp 271?311

3. Barbee TW Jr (1981) AIP Proc 75:131

4. Brytov IA, Grudsky AY, Lazovsky AG (1989) Proc 12th Int Congr on X-ray Optics and Microanalysis, Cracow (Poland) 1:399?402

5. Abèles F (1950) Ann de Physique 12th Series 5:596?640 and 706?784

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