Effects of the physical parameter on gate all around FET
Author:
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://link.springer.com/content/pdf/10.1007/s12046-019-1232-8.pdf
Reference19 articles.
1. Moore G E 1998 Cramming more components onto the integrated circuits. (Reprinted from Electronics, pp. 114–117, April 19, 1965) Proceedings of the IEEE 86: 82–85
2. Young K K 1989 Short-channel effects in fully depleted SOI MOSFETs. IEEE Trans. Electron Devices 36: 399–402
3. Oh S H, Monroe D and Hergenrother J M 2000 Analytic description of short-channel effects in fully-depleted double-gate and cylindrical, surrounding-gate MOSFETs. IEEE Electron Device Lett. 21: 445–447
4. Park J T and Colinge J P 2002 Multiple-gate SOI MOSFETs: device design guidelines. IEEE Trans. Electron Devices 49: 2222–2229
5. Dhiman G and Ghosh P K 2017 Analytical modeling of threshold voltage for double-gate MOSFET. International Conference on Energy, Communication, Data Analytics and Soft Computing (ICECDS), pp. 1584–1588
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Performance Analysis of Gate-All-Around Transistor at Various Technology Nodes;2024 International Conference on Integrated Circuits, Communication, and Computing Systems (ICIC3S);2024-06-08
2. Design and Performance Analysis of Dielectric Modulated MoTe2 Junction-less Tunnel FET based biosensor;2023 IEEE 8th International Conference on Recent Advances and Innovations in Engineering (ICRAIE);2023-12-02
3. Process variations and short channel effects analysis in gate-all-around nanowire field-effect transistor using a statistical Taguchi-Pareto ANOVA framework;2022-10-27
4. Study of 3-nm Cylindrical GAAFETs with Variations in High-k Dielectric Gate-oxide Materials;2022 IEEE Symposium on Industrial Electronics & Applications (ISIEA);2022-07-16
5. Analysis of drain induced barrier lowering for junctionless double gate MOSFET using ferroelectric negative capacitance effect;AIMS Electronics and Electrical Engineering;2022
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3