Robust Statistical Inference for One-Shot Devices Based on Density Power Divergences: An Overview
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Publisher
Springer International Publishing
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https://link.springer.com/content/pdf/10.1007/978-3-030-83670-2_1
Reference40 articles.
1. Aerts, S., Haesbroeck, G.: Robust asymptotic tests for the equality of multivariate coefficients of variation. Test 26(1), 163–187 (2017)
2. Balakrishnan, N., Castilla, E., Martín, N., Pardo, L.: Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data. Metrika 82(8), 991–1019 (2019a)
3. Balakrishnan, N., Castilla, E., Martín, N., Pardo, L.: Robust estimators and test statistics for one-shot device testing under the exponential distribution. IEEE Trans. Inf. Theory 65(5), 3080–3096 (2019b)
4. Balakrishnan, N., Castilla, E., Martín, N., Pardo, L.: Robust inference for one-shot device testing data under exponential lifetime model with multiple stresses. Qual. Reliab. Eng. Int. 36(6), 1916–1930 (2020a).
5. Balakrishnan, N., Castilla, E., Martín, N., Pardo, L.: Robust inference for one-shot device testing data under Weibull lifetime model. IEEE Trans. Reliab. (2020b). https://doi.org/10.1109/TR.2019.2954385
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