Circuits of Ordinary Capacitors
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Publisher
Springer International Publishing
Link
https://link.springer.com/content/pdf/10.1007/978-3-031-14797-5_9
Reference7 articles.
1. Bažant, Z. P., & Le, J.-L. (2017). Probabilistic mechanics of quasibrittle structures—strength, lifetime, and size effect. Cambridge University Press.
2. Kim, Y.-H., & Lee, J. C. (2004). Reliability characteristics of high-k dielectrics. Microelectronics Reliability, 44(2), 183–193.
3. Le, J.-L. (2012). A finite weakest-link model of lifetime distribution of high-k gate dielectrics under unipolar AC voltage stress. Microelectronics Reliability, 52(1), 100–106.
4. Le, J.-L., Bažant, Z. P., & Bazant, M. Z. (2009). Lifetime of high-k gate dielectrics and analogy with strength of quasibrittle structures. Journal of Applied Physics, 106(10), 104119.
5. Phoenix, S., & Tierney, L.-J. (1983). A statistical model for the time dependent failure of unidirectional composite materials under local elastic load-sharing among fibers. Engineering Fracture Mechanics, 18(1), 193–215.
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