A finite weakest-link model of lifetime distribution of high-k gate dielectrics under unipolar AC voltage stress-Reference-Cited by-同舟云学术

A finite weakest-link model of lifetime distribution of high-k gate dielectrics under unipolar AC voltage stress

Published:2012-01 Issue:1 Volume:52 Page:100-106
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Le Jia-Liang

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference38 articles.

1. Activation energy based extreme value statistics and size effect in brittle and quasibrittle fracture;Bažant;J Mech Phys Solids,2007

2. Bažant ZP, Le J-L, Bazant MZ. Scaling of strength and lifetime distributions of quasibrittle structures based on atomistic fracture mechanics. In: Proceedings of national academy of sciences; 2009. p. 11484–9.

3. Reliability assessment of SiO2/ZrO2 stack gate dielectric on strained-Si/Si0.8Ge0.2 heterolayers under dynamic and AC stress;Bera;Mater Sci Semicon Process,2008

4. Principles of statistics;Bulmer,1967

5. Extreme value theory in engineering;Castillo,1998

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Statistical Scaling in Localization-Induced Failures;Applied Mechanics Reviews;2024-06-26

2. Uncovering the dual role of dimensionless radius in buckling of spherical shells with random geometric imperfections;Proceedings of the National Academy of Sciences;2024-04-11

3. Capacitors: Laws, Load Sharing, and Breakdown;Wiley StatsRef: Statistics Reference Online;2022-02-15

4. Weakest Link in Fiber Bundle Models;Wiley StatsRef: Statistics Reference Online;2022-02-15

5. The Fiber Bundle Model;Wiley StatsRef: Statistics Reference Online;2022-02-15