Nickel in silicon studied by electron paramagnetic resonance
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Materials Science,General Chemistry
Link
http://link.springer.com/content/pdf/10.1007/s00339-002-1891-9.pdf
Reference27 articles.
1. K. Graff: Metal Impurities in Silicon-Device Fabrication (Springer, Berlin, Heidelberg 1995)
2. E.R. Weber: Appl. Phys. A 30, 1 (1983)
3. M. Seibt, W. Schröter: Philos. Mag. A 59, 337 (1989)
4. H. Lemke: Phys. Status Solidi (a) 99, 205 (1987)
5. H. Kitagawa, H. Nakashima: Phys. Status Solidi (a) 99, K49 (1989)
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