1. See, for example, S.T. Picraux, F.L. Vook, H.J. Stein: Def. and Rad. Effects in Semicond. 1978, ed. by J.H. Albany, Inst. Phys. Conf. Ser.46, 31 (1979)
2. J.I. Pankove: Cryst. Latt. Def. Amorph. Mater.11, 203 (1985)
3. A.J.R. DeKock, S.D. Ferris, L.C. Kimerling, H.J. Leamy: Appl. Phys. Lett.27, 313 (1975)
4. R.N. Hall: 13th Intl. Conf. Defects in Semicond., ed. by L.C. Kimerling and J.M. Parsey, Jr. (Metallurgical Soc. AIME, Warendale, PA 1985) Vol. 14a, p. 759
5. S.J. Pearton: 13th Intl. Conf. Defects in Semicond, ed. by L.C. Kimerling and J.M. Parsey, Jr. (Metallurgical Soc. AIME, Wavendale, PA 1985) Vol. 14a, p. 737