Surface charge spectroscopy—A novel surface science technique for measuring surface state distributions on semiconductors-Reference-Cited by-同舟云学术

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Surface charge spectroscopy—A novel surface science technique for measuring surface state distributions on semiconductors

Published:1993-09 Issue:9 Volume:22 Page:1141-1146
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Kwok R. W. M.,Lau W. M.,Landheer D.,Ingrey S.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/BF02817686.pdf

Reference16 articles.

1. For example, F.J. Himpsel, F.R. McFeely, A. Taleb-Ibrahimi, J.A. Yarmoff and G. Hollinger,Phys. Rev. B 38, 6084 (1988).

2. W.M. Lau,Appl. Phys. Lett. 54, 338 (1989).

3. W.M. Lau,J. Appl. Phys., 67, 1504 (1990).

4. W.M. Lau and X.-W. Wu,Surf. Sci. 254, 345 (1991).

5. S. Tanuma, C.J. Powell and D.R. Penn,Surf Interface Ana., 11, 577 (1988).

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