Nanoscale Internal Fields in a Biased Graphene–Insulator–Semiconductor Structure-Reference-Cited by-同舟云学术

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Nanoscale Internal Fields in a Biased Graphene–Insulator–Semiconductor Structure

Published:2016-08-19 Issue:17 Volume:7 Page:3434-3439
ISSN:1948-7185
Container-title:The Journal of Physical Chemistry Letters
language:en
Short-container-title:J. Phys. Chem. Lett.

Author:

Rangan Sylvie,Kalyanikar Malathi¹,Duan Junxi,Liu Gang²,Bartynski Robert Allen,Andrei Eva Y.,Feldman Leonard²,Garfunkel Eric¹²

Affiliation:

1. Department of Chemistry and Chemical Biology, Rutgers University, 610 Taylor Road, Piscataway, New Jersey 08854, United States

2. Institute for Advanced Materials, Devices and Nanotechnology, Rutgers University, 607 Taylor Road, Piscataway, New Jersey 08854, United States

Publisher

American Chemical Society (ACS)

Subject

General Materials Science,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpclett.6b01806

Reference36 articles.

1. Use of surface charging in x‐ray photoelectron spectroscopic studies of ultrathin dielectric films on semiconductors

2. A surface charging technique in photoemission spectroscopic studies of dielectric‐semiconductor structures

3. Surface charge spectroscopy—A novel surface science technique for measuring surface state distributions on semiconductors

4. Surface charge spectroscopy and its applications

5. Modified surface charge spectroscopy for the characterization of insulator/semiconductor structures

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1. How flat is the flatband potential?;Journal of Materials Chemistry A;2023

2. Printable Graphene–Insulator–Semiconductor (GIS) Heterostructures for Active Control of Infrared Q‐Switched Laser;Advanced Optical Materials;2021-03-06

3. Band alignment at interfaces of two-dimensional materials: internal photoemission analysis;Journal of Physics: Condensed Matter;2020-07-15

4. Lab-based operando x-ray photoelectron spectroscopy for probing low-volatile liquids and their interfaces across a variety of electrosystems;Journal of Vacuum Science & Technology A;2020-07

5. X-ray Photoelectron Spectroscopy with Electrical Modulation Can Be Used to Probe Electrical Properties of Liquids and Their Interfaces at Different Stages;Langmuir;2019-12-03

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