Improving bias-stress stability of p-type organic field-effect transistors by suppressing electron injection-Reference-Cited by-同舟云学术

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Improving bias-stress stability of p-type organic field-effect transistors by suppressing electron injection

Published:2022-01-22 Issue:7 Volume:33 Page:3726-3737
ISSN:0957-4522
Container-title:Journal of Materials Science: Materials in Electronics
language:en
Short-container-title:J Mater Sci: Mater Electron

Author:

Guo Chunhua,Yang Zhenxin,Qin Lingping,Man Jiaxiu,Zhang Tao,Wang Deng-Ke,Lu Zheng-Hong,Zhu Qiang^ORCID

Funder

National Natural Science Foundation of China

Applied Basic Research Foundation of Yunnan Province

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

https://link.springer.com/content/pdf/10.1007/s10854-021-07564-0.pdf

Reference41 articles.

1. Z. He, Z. Zhang, S. Bi, J. Mater. Sci. 30(24), 20899 (2019)

2. B. Shao, S. Han, S. Hou, H. Zeng, X. Yu, J. Yu, J. Mater. Sci. 30(23), 20638 (2019)

3. S. Park, S.H. Kim, H.H. Choi, B. Kang, K. Cho, Adv. Funct. Mater. 30, 1904590 (2020)

4. W.H. Lee, H.H. Choi, D.H. Kim, K. Cho, Adv. Mater. 26, 1660 (2014)

5. S. Barard, D. Mukherjee, S. Sarkar, T. Kreouzis, I. Chambrier, A.N. Cammidge, A.K. Ray, J. Mater. Sci. 31(1), 265 (2020)

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3. Enhanced Organic Thin-Film Transistor Stability by Preventing MoO₃ Diffusion with Metal/MoO₃/Organic Multilayered Interface Source-Drain Contact;ACS Applied Materials & Interfaces;2022-12-21

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