Electrical properties of boron- and phosphorous-doped microcrystalline silicon thin films prepared by magnetron sputtering of heavily doped silicon targets

Author:

Wang Weiyan,Huang Jinhua,Xu Wei,Huang Junjun,Zeng Yuheng,Song Weijie

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. W.E. Spear, P.G. Le Comber, Solid State Commun. 17, 1193 (1975)

2. T. Voutsas, H. Nishiki, M. Atkinson et al., Sputtering technology of Si films for low-temperature Poly-Si TFTs. Sharp tech. J. 80, 36 (2001)

3. M.M. De Lima Jr, F.C. Marques, On the doping mechanism of boron-doped hydrogenated amorphous silicon deposited by rf-co-sputtering. J. Non-Cryst. Solids 605, 299–302 (2002)

4. Y. Ohmura, M. Takahashi, M. Suzuki, P-type doping of hydrogenated amorphous silicon films with boron by reactive radio-frequency co-sputtering. Phys. B 257, 308–310 (2001)

5. Y. Ohmura, M. Takahashi, M. Suzuki et al., N-type (P, Sb) and p-type (B) doping of hydrogenated amorphous Si by reactive rf co-sputtering. Phys. Stat. Sol. (b) 235, 111 (2003)

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