1. Frear, D.R., Jang, J.W., Lin, J.K., Zhang, C. JOM, 53(6), 28 (2001)
2. Kang, S.K., Lauro, P., Shih, P.D.-Y., Henderson, D.W., Bartelo, J., Gosselin, T., Cain, S.R., Goldsmith, C., Puttlitz, K., Hwang, T.K., Choi, W.K. Mater. Trans. Jpn. Inst. Metal., 45(3), 1 (2004)
3. Moon, K.W., Boettinger, W.J., Kattner, U.R., Biancaniello, F.S., Handwerker, C.A. J. Electron. Mater., 29, 1122 (2000)
4. Henderson, D.W., Grosselin, T., Sarkhel, A., Kang, S.K., Choi, W.-K., Shih, D.-Y., Goldsmith, C., Puttlitz, K.L. J. Mater Res., 17, 2775 (2002)
5. Lehman, L.P., Kinyanjui, R.K., Zavalij, L., Zribi, A., Cotts, E.J. Proc. 53rd Electronic Components and Tech. Conf. (Piscataway, NJ: IEEE 2003), p.1215 (2003)