Robust Thermal Design for Power Device Package Using Response Surface Method and Monte Carlo Simulation

Author:

YOKONO Yasuyuki1,HISANO Katsumi1,HIROHATA Kenji1

Affiliation:

1. Toshiba Corporation

Publisher

Japan Society of Mechanical Engineers

Subject

Engineering (miscellaneous),Instrumentation,General Materials Science,Atomic and Molecular Physics, and Optics

Reference11 articles.

1. (1) Kraus, A. D. and Bar-Cohen, A., 1983, “Thermal Analysis and Control of Electronic Equipment,” Hemisphere

2. (2) Nakayama, W., 1986, “Thermal Management of Electronic Equipment: A Review of Technology and Research Topics,” Applied Mechanics Reviews, Vol. 39, No. 12, pp. 1847-1868

3. (3) Tummala, R. R. and Rymaszwski, E. J., 1989, “Microelectronics Packaging Handbook,” Van Nostrand Reinhold Ltd.

4. (4) Lall, B. S., Ortega, A., et al., 1994, “Thermal Design for Electronic Components on Conducting Boards in Passively Cooled Enclosures,” Proceedings of 4th Intersociety Conference on Thermal Phenomena in Electronic Systems, pp. 50-61.

5. (5) Yokono, Y., and Hisano, K., 1993, “Numerical Simulation for Thermal Resistance of Finned LSI Packages,” ASME EEP, Vol. 4-2, pp. 887-892

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