Anomalous Surface Deformation of Sapphire Clarified by 3D-FEM Simulation of the Nanoindentation-Reference-Cited by-同舟云学术

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Anomalous Surface Deformation of Sapphire Clarified by 3D-FEM Simulation of the Nanoindentation

Published:2003 Issue:3 Volume:46 Page:265-271
ISSN:1344-7912
Container-title:JSME International Journal Series A
language:en
Short-container-title:JSME Int. J., Ser. A

Author:

NOWAK Roman¹,MANNINEN Timo²,LI Chunliang³,HEISKANEN Kari¹,HANNULA Simo-Pekka⁴,LINDROOS Veikko¹,SOGA Tetsuo⁵,YOSHIDA Fusahito⁶

Affiliation:

1. Department of Materials Science&Rock Engineering, Helsinki University of Technology

2. Department of Engineering Physics&Mathematics, Helsinki University of Technology

3. MASS Research Center, Japan Electronics Industry Ltd.

4. VTT Industrial Systems

5. Nagoya Institute of Technology

6. Department of Mechanical Engineering, Hiroshima University

Publisher

Japan Society of Mechanical Engineers

Subject

Mechanical Engineering,General Materials Science

Link

http://www.jstage.jst.go.jp/article/jsmea/46/3/46_3_265/_pdf

Reference33 articles.

1. Chemical and structural transformation of sapphire (Al2O3) surface by plasma source nitridation

2. Sapphire filter thickness optimization in neutron scattering instruments

3. A new high pressure sapphire nuclear magnetic resonance cell

4. Monolithic sapphire parametric transducer operation at cryogenic temperatures

5. Contact fracture of brittle bilayer coatings on soft substrates

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Stress Analysis by Means of Raman Microscopy;Confocal Raman Microscopy;2018

2. Evolution of material removal modes of sapphire under varied scratching depths;Ceramics International;2017-09

3. Investigation of the vibrational modes of ZnO grown by MOCVD on different orientation planes;Journal of Raman Spectroscopy;2014-12-22

4. Origin of the Raman mode at 379 cm−1 observed in ZnO thin films grown on sapphire;Journal of Raman Spectroscopy;2011-02-23

5. Stress Analysis by Means of Raman Microscopy;Confocal Raman Microscopy;2010

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