1. (1) Jasperson, S. N. and Schnatterly, S. E., An Improved Method for High Reflectivity Ellipsometry Based on a New Polarization Modulation Technique, The Review of Scientific Instruments, Vol. 40, No. 6 (1969), p. 761.
2. (2) Modine, F. A., Major, R. W. and Sonder, E., High Frequency Polarization Modulation Method for Measuring Birefringence, J. of Applied Optics, Vol. 14, No. 3 (1975), p. 757.
3. (3) Modine, F. A. and Major, R. W., High Frequency Polarization Modulation Method for Measuring Optical Rotation, J. of Applied Optics, Vol. 14, No. 3 (1975), p. 761.
4. (4) Niitsu, Y., Ichinose, K. and Ikegami, K., Stress Measurement of Transparent Solid Materials by Polarized Laser, Proc. ASME & JSME Joint Conference on Electronics Packaging, Vol. 2 (1992), p. 1005.
5. (5) Ichinose, K., Niitsu, Y. and Ikegami, K., Residual Stress Measurement of Adhesive Layer by Polarized Laser, (in Japanese), Trans. Jpn. Soc. Mech. Eng., Vol. 58, No. 554, A (1992), p. 1900.