An Improved Method for High Reflectivity Ellipsometry Based on a New Polarization Modulation Technique
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1684062
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4. Measurement of Optical Constants: Optical Constants of Liquid Mercury at 5461 Å*
5. Photoelectric Analysis of Elliptically Polarized Light
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