Direct Noise-Resistant Edge Detection with Edge-Sensitive Single-Pixel Imaging Modulation

Abstract

The majority of edge detection methods are applied after the capture of object photos. Thus, edge detection quality suffers when disturbances occur during imaging. This work proposes an effective edge detection technique for single-pixel imaging (SI). A sequence of edge-sensitive single-pixel imaging (ESI) and single-round edge-sensitive single-pixel imaging (SESI) modulation patterns is specially designed to extract the edges of unknown objects directly without the need for any previous images. The modulation patterns are formed by convolving the SI basis patterns with a second-order differential operator. Compared with existing published edge detection methods, experimental results revealed that the proposed SESI increased the signal-to-noise ratio by at least 228%, thereby reducing the edge detection time by at least half. The edge detection performance of the SESI scheme was also demonstrated on moving objects, with SESI detecting clear edges even when the target was in motion. Moreover, unlike traditional methods, ESI and SESI are immune to light interference and can detect clear edges of objects even if the objects are corrupted by severe interference from laser or light-emitting diode light sources, whereas traditional methods exhibit substantial noise contamination. Consequently, ESI and SESI can lay the groundwork for fast and robust edge detection operations without imaging.