Fatigue Testing of Copper Nanoparticle-Based Joints and Bonds

Author:

Sivasubramony Rajesh Sharma1,Kokash Maan Zaid1,Thekkut Sanoop1,Shahane Ninad2,Thompson Patrick2,Mirpuri Kabir3,Kawana Yuki4,Greene Christopher M.1,Borgesen Peter1

Affiliation:

1. Department of Systems Science and Industrial Engineering, Binghamton University, Binghamton, NY 13902

2. Texas Instruments Inc., Santa Clara, CA 95051

3. NXP Semiconductors, Chandler, AZ 85224

4. Hitachi Chemical Co., Ltd., Ibaraki 300-4247, Japan

Abstract

Abstract Fused or sintered Cu nanoparticle structures are potential alternatives to solder for ultrafine pitch flip chip assembly and to sintered Ag for heat sink attach in high-temperature micro-electronics. Meaningful testing and interpretation of test results in terms of what to expect under realistic use conditions do, however, require a mechanistic picture of degradation and damage mechanisms. As far as fatigue goes, such a picture is starting to emerge. The porosity of sintered nanoparticle structures significantly affects their behavior in cycling. The very different sensitivities to parameters, compared to solder, mean new protocols will be required for the assessment of reliability. This study focused on fatigue in both isothermal and thermal cycling. During the latter, all damage occurs at the low-temperature extreme, so life is particularly sensitive to the minimum temperature and any dwell there. Variations in the maximum temperature up to 125 °C did not affect, but a maximum temperature of 200 °C led to much faster damage. Depending on particle size and sintering conditions, deformation and damage properties may also degrade rapidly over time. Our picture allows for recommendations as to more relevant test protocols for vibration, thermal cycling, and combinations of these, including effects of aging, as well as for generalization of test results and comparisons in terms of anticipated behavior under realistic long-term use conditions. Also, the fatigue life seems to vary with the ultimate strength, meaning that simple strength testing becomes a convenient reference in materials and process optimization.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A study on the thermomechanical response of various die attach metallic materials of power electronics;Soldering & Surface Mount Technology;2024-05-09

2. Research on the creep response of lead-free die attachments in power electronics;International Journal of Structural Integrity;2024-05-07

3. Copper-Based Nanomaterials for Fine-Pitch Interconnects in Microelectronics;Accounts of Chemical Research;2023-06-08

4. Micro-cantilever Bending Test of Sintered Cu nanoparticles for Power Electronic Devices;2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2023-04-17

5. Effective Constitutive Relations for Sintered Nano Copper Joints;Journal of Electronic Packaging;2022-11-11

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