Moisture Absorption Analysis of Interfacial Fracture Test Specimens Composed of No-Flow Underfill Materials
Author:
Ferguson Timothy1, Qu Jianmin1
Affiliation:
1. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0405
Abstract
In a previous study, we found that moisture preconditioning strongly influenced the interfacial fracture toughness of the underfill/solder mask interface, decreasing the interfacial adhesion by approximately one-half for both classifications of underfill/solder mask interfaces after 725 h of exposure at 85°C/85%RH. To better understand the rate and mechanisms for moisture transport through the interfacial fracture test specimens, a diffusion analysis was implemented based on traditional, analytical solutions of Fick’s second law of diffusion. Test specimens were constructed to experimentally determine the diffusion coefficient for each underfill. Since both underfill encapsulants proved to exhibit non-Fickian behavior at 85°C/85%RH, the application of the analytical Fickian solution for the test specimens was limited to the associated JEDEC criteria of 168 hours for 85°C/85%RH. A finite element analysis was performed to illustrate the moisture concentration in the interfacial fracture test specimens for initial times of exposure to the humid environment. The results of this study demonstrate that the presence of amine functional groups considerably retard moisture penetration through underfill encapsulants.
Publisher
ASME International
Subject
Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials
Reference9 articles.
1. Soles, C., and Yee, A., 2000, “A Discussion of the Molecular Mechanisms of Moisture Transport in Epoxy Resins,” J. Polym. Sci., Part B: Polymer Physics, 38, pp. 792–802. 2. Soles, C., Chang, T., Gidley, D., and Yee, A., 2000, “Contributions of the Nanovoid Structure to the Kinetics of Moisture Transport in Epoxy Resins,” J. Polym. Sci., Part B: Polymer Physics, 38, pp. 776–791. 3. Ferguson, T., and Qu, J., 2001, “Effect of Moisture on the Interfacial Adhesion of the Underfill/Solder Mask Interface,” ASME J. Electron. Packag. 124, pp. 106–110. 4. Crank, J., 1956, The Mathematics of Diffusion, Clarendon Press, Oxford, UK. 5. Shi, S., 2000, “Study on No-Flow Underfill Materials for Low-Cost Flip-Chip Applications,” doctoral thesis, Georgia Institute of Technology, School of Materials Science Engineering, Atlanta, GA.
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