1. Lall, P., Pecht, M., and Harkim, E., 1997, Influence of Temperature on Microelectronics and System Reliability, CRC Press, New York.
2. Kirschman, R. K.
, 1990, “Low Temperature Electronics,” IEEE Circuits Devices Mag., , 6, Part 2, pp. 12–24.
3. Lasance, C. J. M., 1997, “Status and Challenges in Thermal Design of Electronic Parts and Systems,” Proc. Eurotherm Seminar 58: Thermal Management of Electronic Systems III, edited by Bardon, J. P., Beyne, E., and Saulnier, J. B., Elsevier, Paris, pp. 91–107.
4. Nakayama, W., 2001, “Emerging New Roles of CFD Simulation in Competitive Market Environment,” Proc. 7th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), pp. 223–229.
5. Nakayama, W., 2001, “An Approach to Fast Thermal Design of Compact Electronic Systems: a JSME Project,” Advances in Electronic Packaging; Proc of The PACIFIC RIM/ASME International, Intersociety Electronic Packaging Technical/Business Conf & Exhibition (IPACK’01), Paper No. IPACK2001-15532.