Joint Analysis and Reliability Test of Epoxy-Based Nano Silver Paste Under Different Pressure-Less Sintering Processes

Author:

Wang Xinyue1,Zeng Zejun1,Zhang Guoqi2,Zhang Jing3,Liu Pan4

Affiliation:

1. Faculty of Academy for Engineering & Technology, Fudan University, No. 220, Handan Road, Yangpu District, Shanghai 200433, China

2. Electronic Components, Technology, and Materials, Delft University of Technology, Mekelweg 4, Delft 2628 CD, The Netherlands; Shenzhen Institute of Wide-Bandgap Semiconductors, Shenzhen 518131, China

3. Heraeus Materials Technology Shanghai Ltd, No. 1, Guangzhong Road, Minhang District, Shanghai 201108, China

4. Faculty of Academy for Engineering & Technology, Fudan University, No. 220, Handan Road, Yangpu District, Shanghai 200433, China; Yiwu Research Institute of Fudan University, Building 5, Zhongfu Plaza, Chengbei Road, Yiwu City, Zhejiang Province 322000, China; Research Institute of Fudan University in Ningbo, 901 Binhai Er Road, Hangzhou Bay New Area, Ningbo, Zhejiang Province 315336, China

Abstract

Abstract Recent years, the sintered silver paste was introduced and further developed for power electronics packaging due to low processing temperature and high working temperature. The pressure-less sintering technology reduces the stress damage caused by the pressure to the chip, improves reliability, and is widely applied in manufacturing. Currently, most existed studies are focused on alcohol-based sintered silver pastes while resins have been demonstrated to improve the bonding properties of solder joints. Hence, the performance and sintering mechanisms with epoxy-based silver paste need to be further explored. In this work, a methodology for multifactor investigation is settled on the epoxy-based silver paste to reveal the relationship between the strength and the different influence factors. We first analyzed the characteristics of commercialized epoxy-based silver paste samples, including silver content, silver particle size, organic composition, sample viscosity, and thermal conductivity. Samples were then prepared for shear tests and microstructure analysis under different pressure-less sintering temperatures, holding time, substrate surface, and chip size. Full factor analysis results were further discussed in detail for correlation. The influence factors were ranked from strong to weak as follows: sintering temperature, substrate surface, chip size, and holding time. Finally, a thermal cycling test was carried out for reliability analysis. Epoxy residues are one of the possible reasons, which result in shear strength decreasing exponentially.

Funder

Fudan University

Guangdong Science and Technology Department

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

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