Strength and Isothermal Fatigue Resistance of SnBi/SnAgCu Joints Reflowed at Low Temperatures

Author:

Yadav Manu1,Alghoul Thaer1,Thekkut Sanoop1,Das Ronit1,Greene Christopher1,Borgesen Peter1,Sakib A. R. Nazmus2,Wentlent Luke3,Joshi Shantanu4

Affiliation:

1. Department of Systems Science and Industrial Engineering, Binghamton University, Binghamton, NY 13902

2. NXP Semiconductors, Austin, TX 78735

3. Universal Instruments Corp., Conklin, NY 13748

4. Koki Solder America Inc., Cincinnati, OH 45248

Abstract

Abstract Soldered micro-electronics assemblies may have to survive a variety of mechanical loads in repeated drops, cyclic bending, or vibration. A very large body of work has addressed the isothermal fatigue performance of SnAgCu solder joints. This work offers a general assessment of the achievable performance of so-called hybrid solder joints formed by soldering with eutectic SnBi or SnBiAg to SnAgCu bumps on area array components. This allows for soldering at much lower temperatures than with SnAgCu alone, but the deformation and damage properties of the resulting structures depend strongly on details of the design and process. A peak reflow temperature of 175 °C was shown to be sufficient to ensure that the life of the joints remains limited by fatigue of the unmixed SnAgCu near the component. However, a higher effective stiffness of the mixed region near the substrate means that the life will be lower by 45%.

Funder

Binghamton University

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference50 articles.

1. Low Melting Point Solders Based on Sn, Bi, and in Elements;J. Mater. Today Adv.,2020

2. Mechanical Properties and Joint Reliability Improvement of Sn-Bi Alloy;Proceedings of 13th IEEE Electronic Packaging Technology Conference,2011

3. Microstructure and Mechanical Properties of Pb-Free Solder Alloys for Low-Cost Electronic Assembly: A Review;J. Electr. Mater.,1994

4. Interfacial Embrittlement by Bismuth Segregation in Copper/Tin–Bismuth Pb-Free Solder Interconnect;J. Mater. Res.,2001

5. Transition of Bi Embrittlement of SnBi/Cu Joint Couples With Reflow Temperature;J. Mater. Res.,2011

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