System for Real-Time Measurement of Thermally Induced PWB/PWA Warpage

Author:

Stiteler M. R.1,Ume I. C.2

Affiliation:

1. South Carolina Research Authority, 5300 International Blvd., North Charleston, SC 29418

2. School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0405

Abstract

An automated on-line warpage measurement system for printed wiring board assemblies (PWBAs) has been developed. The system is capable of simulating an infrared reflow soldering process and performing real-time PWBA warpage measurements using the shadow moire´ technique. The system can be used to characterize the warpage behavior of virtually any PWBA during infrared soldering processes as well as during operational conditions. Using this system, warpage of PWB test vehicles was measured during simulated infrared reflow soldering. The measurement results and the measurement system will be presented. The measured warpage varied significantly during reflow soldering from that observed both before and after reflow. These results help us to understand how the board deforms at every stage of the reflow process.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. Chang, F. P., “Moire´ Methods of Strain Analysis,” SESA Manual on Experimental Stress Analysis, 3rd ed., pp. 290–308.

2. Fu C. , and UmeC., 1995, “Characterizing the Temperature Dependence of Electronic Packaging Material Properties,” JOM, Vol. 47, No. 6, pp. 31–35.

3. Guo, Y., 1995, “Application of Shadow Moire´ Method in Electronic Packaging,” Proceedings, 1995 SEM Spring Conference and Exhibit, Grand Rapids, MI, June 12–14.

4. Kobayashi, A., ed., Handbook on Experimental Mechanics, Prentice Hall, NJ, pp. 282–313.

5. Tsang, C., Stiteler, M., and Ume, C., 1995, “Real-Time Measurement of Printed Wiring Board Flatness in a Simulated Manufacturing Environment,” INTERpack ’95, Lahaina, Hawaii, March 26–30.

Cited by 26 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Correlation Study of Mobile DRAM Warpage;2022 23rd International Conference on Electronic Packaging Technology (ICEPT);2022-08-10

2. Warpage Simulation of a Multilayer Printed Circuit Board and Microelectronic Package Using the Anisotropic Viscoelastic Shell Modeling Technique That Considers the Initial Warpage;IEEE Transactions on Components, Packaging and Manufacturing Technology;2016-11

3. Anisotropic viscoelastic shell modeling technique of copper patterns/photoimageable solder resist composite for warpage simulation of multi-layer printed circuit boards;Journal of Micromechanics and Microengineering;2015-09-15

4. Measurement of Surface Topography of Transparent Objects by Using Digital Phase-Shifting Shadow Moiré Method Without Painting;Advancement of Optical Methods in Experimental Mechanics, Volume 3;2013-08-08

5. Modeling Validation Tools;Modeling and Simulation for Microelectronic Packaging Assembly;2011-09-02

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3