1. Chang, F. P., “Moire´ Methods of Strain Analysis,” SESA Manual on Experimental Stress Analysis, 3rd ed., pp. 290–308.
2. Fu
C.
, and UmeC., 1995, “Characterizing the Temperature Dependence of Electronic Packaging Material Properties,” JOM, Vol. 47, No. 6, pp. 31–35.
3. Guo, Y., 1995, “Application of Shadow Moire´ Method in Electronic Packaging,” Proceedings, 1995 SEM Spring Conference and Exhibit, Grand Rapids, MI, June 12–14.
4. Kobayashi, A., ed., Handbook on Experimental Mechanics, Prentice Hall, NJ, pp. 282–313.
5. Tsang, C., Stiteler, M., and Ume, C., 1995, “Real-Time Measurement of Printed Wiring Board Flatness in a Simulated Manufacturing Environment,” INTERpack ’95, Lahaina, Hawaii, March 26–30.