Submodeling Analysis for Path-Dependent Thermomechanical Problems
Author:
Affiliation:
1. Stress-Reliability Lab, Advanced Semiconductor Engineering, Inc., 26 Chin 3rd Rd., Nantze Export Processing Zone, 811 Nantze, Kaohsiung, Taiwan
Abstract
Publisher
ASME International
Subject
Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials
Link
http://asmedigitalcollection.asme.org/electronicpackaging/article-pdf/127/2/135/5677654/135_1.pdf
Reference18 articles.
1. Finite Element Analysis of Solder Ball Connect (SBC) Structural Design Optimization;Corbin;IBM J. Res. Dev.
2. A Full-Scale 3D Finite Element Analysis for No-underfill Flip Chip Package;Hsu
3. Application of Incompatible Mesh in Three-dimensional Analysis of Flip-chip Ball Grid Array Assembly;Kao
4. Solder Joint Reliability Modeling for a 540 I/O Plastic Ball-grid-array Assembly;Su
5. Finite Element Modeling of BGA Packages for Life Prediction;Gustafsson
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