Submodeling Analysis for Path-Dependent Thermomechanical Problems

Author:

Wang Tong Hong1,Lai Yi-Shao1

Affiliation:

1. Stress-Reliability Lab, Advanced Semiconductor Engineering, Inc., 26 Chin 3rd Rd., Nantze Export Processing Zone, 811 Nantze, Kaohsiung, Taiwan

Abstract

In a finite element analysis, when localized behavior of a large model is of particular concern, generally one would refine the mesh until it captures the local solution adequately. Submodeling is an alternative way for solving this kind of problem. It provides a relatively accurate solution at a modest computational cost. For a valid submodeling analysis, the boundaries of the submodel should be sufficiently far away from local features so that St. Venant’s principle holds. Moreover, special treatments are required for solving problems that involve path-dependent characteristics. This paper presents a general procedure to perform submodeling analyses for path-dependent thermomechanical problems without a priori assumptions on the structural response. The procedure was benchmarked using a bimaterial strip and demonstrated through analyses on a bump chip carrier package assembly. The procedure is conducive to the numerical assessment of fatigue lives of electronic packages.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. Finite Element Analysis of Solder Ball Connect (SBC) Structural Design Optimization;Corbin;IBM J. Res. Dev.

2. A Full-Scale 3D Finite Element Analysis for No-underfill Flip Chip Package;Hsu

3. Application of Incompatible Mesh in Three-dimensional Analysis of Flip-chip Ball Grid Array Assembly;Kao

4. Solder Joint Reliability Modeling for a 540 I/O Plastic Ball-grid-array Assembly;Su

5. Finite Element Modeling of BGA Packages for Life Prediction;Gustafsson

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