Power and Thermal Constraints-Driven Modeling and Optimization for Through Silicon Via-Based Power Distribution Network
Author:
Affiliation:
1. School of Microelectronics, Xidian University, Xi'an 710071, Shaanxi, China
2. School of Microelectronics, Xidian University, Xi'an 710071, Shaanxi, China e-mail:
Abstract
Funder
National Natural Science Foundation of China
National Defense Pre-Research Foundation of China
Publisher
ASME International
Subject
Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials
Link
http://asmedigitalcollection.asme.org/electronicpackaging/article-pdf/doi/10.1115/1.4040670/6367644/ep_140_04_041002.pdf
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4. Through-Silicon Vias: Drivers, Performance, and Innovations;IEEE Trans. Compon., Packag., Manuf. Technol.,2016
5. Lee, H. M., Liu, E. X., Samudra, G., Li, E. P., Li, H. Y., and Teo, K. H., 2016, “Power Integrity Modeling and Measurement of TSV-Based 3D IC System With Application to the Analysis of Seven-Chip Stack,” IEEE Electromagn. Compat. Mag., 5(3), pp. 52–60.10.1109/MEMC.0.7764251
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