Peeling in Bimaterial Beams: The Peeling Moment and Its Relation to the Differential Rigidity-Reference-Cited by-同舟云学术

Peeling in Bimaterial Beams: The Peeling Moment and Its Relation to the Differential Rigidity

Published:2004-03-01 Issue:2 Volume:71 Page:290-292
ISSN:0021-8936
Container-title:Journal of Applied Mechanics
language:en
Short-container-title:

Author:

Moore Thomas D.¹²,Jarvis John L.³

Affiliation:

1. Analog Devices B.V., Raheen Business Park, Limerick, Ireland

2. Thermomechanical Solutions, Limerick, Ireland

3. Department of Mechanical and Aeronautical Engineering, University of Limerick, Limerick, Ireland

Abstract

Two-layer beams (i.e., bimaterials) under thermomechanical stress are prone to peeling or delamination at the free edges. The self-equilibrating peeling stress gives rise to a peeling moment Mp close to the free ends. A simple and exact formula for Mp is presented in which the sign of Mp indicates whether the beam is prone or resistant to delamination. The effect on both the sign and magnitude of Mp of the flexural rigidities of both layers is examined. As the stiffness of one layer becomes dominant, the magnitude of the differential rigidity converges to one-half the thickness of the opposite layer.

Publisher

ASME International

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics

Link

http://asmedigitalcollection.asme.org/appliedmechanics/article-pdf/71/2/290/5470956/283_1.pdf

Reference6 articles.

1. Moore, T. D., and Jarvis, J. L., 2003, “A Simple and Fundamental Design Rule for Resisting Delamination in Bimaterial Structures,” Microelectron. Reliab., 43(3), pp. 487–494.

2. Timoshenko, S. , 1925, “Analysis of Bi-metal Thermostats,” J. Opt. Soc. Am., 11(Sept.), pp. 233–255.

3. Suhir, E. , 1986, “Stresses in Bi-metal Thermostats,” ASME J. Appl. Mech., 53, pp. 657–660.

4. Suhir, E. , 1989, “Interfacial Stresses in Bi-metal Thermostats,” ASME J. Appl. Mech., 56, pp. 595–600.

5. Ru, C. Q. , 2002, “Interfacial Thermal Stresses in Bimaterial Beams: Modified Beam Models Revisited,” ASME J. Electron. Packag., 124, pp. 141–146.

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