Dislocation Density Tensor Characterization of Deformation Using 3D X-Ray Microscopy

Author:

Larson B. C.1,Tischler J. Z.1,El-Azab Anter2,Liu Wenjun3

Affiliation:

1. Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831

2. Mechanical Engineering Department, Florida State University, Tallahassee, FL 32310

3. Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439

Abstract

Three-dimensional (3D) X-ray microscopy with submicron resolution has been used to make spatially resolved measurements of lattice curvature and elastic strain over two-dimensional slices in thin deformed Si plates. The techniques and capabilities associated with white-beam 3D X-ray microscopy are discussed, and both theoretical and experimental considerations associated with the measurement of Nye dislocation density tensors in deformed materials are presented. The ability to determine the local geometrically necessary dislocation (GND) density in the form of a dislocation density tensor, with micron spatial resolution over mesoscopic length scales, is demonstrated. Results are shown for the special case of an elastically bent (dislocation free) thin Si plate and for a similar thin Si plate that was bent plastically, above the brittle-to-ductile transition temperature, to introduce dislocations. Within the uncertainties of the measurements, the known result that GND density is zero for elastic bending is obtained, and well-defined GND distributions are observed in the plastically deformed Si plate. The direct and absolute connection between experimental measurements of GND density and multiscale modeling and computer simulations of deformation microstructures is discussed to highlight the importance of submicron-resolution 3D X-ray microscopy for mesoscale characterization of material defects and to achieve a fundamental understanding of deformation in ductile materials.

Publisher

ASME International

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Cited by 29 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3