Unsteady Wire Sweep Due to Transfer Molding in a 160L QFP Package

Author:

Chai H.1,Zohar Y.1

Affiliation:

1. Department of Mechanical Engineering, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong

Abstract

Wire sweep has been recognized as one of the major defects in encapsulation of electronic components by transfer molding. The phenomenon is very complicated as it is sensitive to a large number of parameters. In this experimental work, where a 160L QFP package used as the test vehicle, the detailed time-dependent wire displacement is measured for the following two different flow initial conditions: (i) the wire is immersed in the liquid and is displaced due to the acceleration of the flow from rest to the steady-state velocity, and (ii) the wire is surrounded by the ambient air and is displaced first due to the passage of the liquid front and then due to the hydrodynamic load. Significant differences have been observed between the two cases, with important implications for analytical and numerical studies of wire sweep.

Publisher

ASME International

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Chai, H., and Zohar, Y., 1997, “Wire Sweep due to transfer molding in a 160L QFP package Under Steady-State Conditions,” ASME JOURNAL OF ELECTRONIC PACKAGING, in press.

2. Chen, X. H., Yuen, M. M. F., and Tong, P., 1996, “Flow Modeling of Wire Sweep in Transfer Molding,” Proceedings, ASME Winter Annual Meeting, EEP-Vol. 17, 55.

3. Han S. , and WangK. K., 1995, “A Study on Wire Sweep in Encapsulation of Semiconductor Chips Using Simulated Experiments,” ASME JOURNAL OF ELECTRONIC PACKAGING, Vol.117, p. 178178.

4. Hunter W. L. , 1987, “Association of Bonding-Wire Displacement With Gas Bubbles in Plastic-Encapsulated Integrated Circuits,” IEEE Trans. Comp., Hybrids, Manuf. Tech., CHMT-10, p. 327327.

5. Manzione, L. T., 1983, “Packaging of Microelectronic Devices,” SPE 41st ANTEC, p. 77.

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