Surface Modification and Measurement Using a Scanning Tunneling Microscope With a Diamond Tip
Author:
Affiliation:
1. Computer Mechanics Laboratory, Department of Mechanical Engineering, University of California, Berkeley, Calif. 94720
Abstract
Publisher
ASME International
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanical Engineering,Mechanics of Materials
Link
http://asmedigitalcollection.asme.org/tribology/article-pdf/114/3/493/5688224/493_1.pdf
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1. Preparation and characterization of conductive diamond for a scanning tunneling microscope tip;Diamond and Related Materials;2022-12
2. Manufacturing and Characterization of Nanostructures Using Scanning Tunneling Microscopy with Diamond Tip;Journal of Nano Research;2016-07
3. The Structure and Bonding State for Fullerene-Like Carbon Nitride Films with High Hardness Formed by Electron Cyclotron Resonance Plasma Sputtering;Japanese Journal of Applied Physics;2012-12-01
4. The Structure and Bonding State for Fullerene-Like Carbon Nitride Films with High Hardness Formed by Electron Cyclotron Resonance Plasma Sputtering;Japanese Journal of Applied Physics;2012-11-22
5. Fabrication and characterization of single crystal semiconductive diamond tip for combined scanning tunneling microscopy;Diamond and Related Materials;2008-07
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