Development of a New Focused Ion Beam Preparation Method of Thin Film for TEM with FIB: A Method Capable of Re-thinning After TEM Observation-Reference-Cited by-同舟云学术

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Development of a New Focused Ion Beam Preparation Method of Thin Film for TEM with FIB: A Method Capable of Re-thinning After TEM Observation

Published:2004 Issue:5 Volume:68 Page:293-298
ISSN:0021-4876
Container-title:Journal of the Japan Institute of Metals
language:ja
Short-container-title:J. Japan Inst. Metals

Author:

Suzuki Toshiaki,Sibata Masateru,Okunishi Eiji,Endo Noriaki,Kuba Toshiko

Publisher

Japan Institute of Metals

Subject

Materials Chemistry,Metals and Alloys,Mechanics of Materials,Condensed Matter Physics

Link

https://www.jstage.jst.go.jp/article/jinstmet/68/5/68_5_293/_pdf

Reference7 articles.

1. 4) Y. Yabuuchi: Proceeding of 9^th Colloquium on Analytical Electron Microscopy (in Japanese) (1993) p.44.

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1. B13-P-07Evaluation of cross-sections of low melting point metals prepared by an FIB equipped with a cooling stage;Microscopy;2015-11

2. An Evaluation of FIB Cross-Sectioning Using a Cooling Stage for Metals and Alloys with Low Melting Point;Materials Science Forum;2013-03

3. Specimen Preparation Methods with FIB for In-Situ TEM Observations in Materials Science
^|^mdash;TEM Specimen Preparation by FIB with Glass Manipulator^|^mdash;;Materia Japan;2012

4. Formation of undulated lamellar structure from ABC block terpolymer blends with different chain lengths;The Journal of Chemical Physics;2010-11-21

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