Specimen Preparation Methods with FIB for In-Situ TEM Observations in Materials Science^|^mdash;TEM Specimen Preparation by FIB with Glass Manipulator^|^mdash;
Author:
Publisher
Japan Institute of Metals
Subject
General Medicine
Link
https://www.jstage.jst.go.jp/article/materia/51/12/51_545/_pdf
Reference15 articles.
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3. Development of a New Focused Ion Beam Preparation Method of Thin Film for TEM with FIB: A Method Capable of Re-thinning After TEM Observation
4. (7) D. B. Bogy: J. Appl. Mech., 35(1968), 460(7pages).
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