Activity Measurements of Ga in GaAs–InAs Solid Solutions by the EMF Method
Author:
Affiliation:
1. Department of Materials Science and Prosessing, Faculty of Engineering, Osaka University
2. Graduate Student, Osaka University
Publisher
Japan Institute of Metals
Subject
General Engineering
Link
https://www.jstage.jst.go.jp/article/matertrans1989/30/5/30_5_354/_pdf
Reference42 articles.
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3. 3) E. F. Hockings, I. Kudman, T. E. Seidel, C. M. Schmelz and E. F. Steigmeier: J. Appl. Phys., 37 (1966), 2879.
4. 4) for example: (a) G. A. Antypas: J. Electrochem. Soc., 117 (1970), 1393;
5. (b) C. P. Kuo, R. M. Cohen, K. L. Fry and G. B. Stringfellow: J. Electronic Mater., 14 (1985), 231;
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