Determination of Structure Factors of Al<SUB>2</SUB>O<SUB>3</SUB> by means of Large Angle Convergent Beam Electron Diffraction-Reference-Cited by-同舟云学术

Determination of Structure Factors of Al₂O₃ by means of Large Angle Convergent Beam Electron Diffraction

Published:1995 Issue:11 Volume:36 Page:1344-1348
ISSN:0916-1821
Container-title:Materials Transactions, JIM
language:en
Short-container-title:Mater. Trans., JIM

Author:

Tomokiyo Yoshitugu¹,Kuroiwa Takeharu²,Hayashi Yasunori²

Affiliation:

1. Research Laboratory of High Voltage Electron Microscope, Kyushu University

2. Department of Materials Science and Engineering, Faculty of Engineering, Kyushu University

Publisher

Japan Institute of Metals

Subject

General Engineering

Link

https://www.jstage.jst.go.jp/article/matertrans1989/36/11/36_11_1344/_pdf

Reference18 articles.

1. 1) D. B. Williams: Practical Analytical Electron Microscopy in Materials Science, Philips Electronic Instruments, Inc., Electron Optics Publishing Group, New Jersy, (1984).

2. 2) M. Tanaka, M. Terauchi and T. Kaneyama: Convergent-beam electron diffraction II, Tokyo, JEOL-Maruzen, (1988).

3. 3) J. A. Eades Ed.: Special Issues of the Journal of Electron Microscopy Technique on Convergent-Beam Electron Diffraction, Vol. 13, Nos. 1, 2 (1989).

4. 4) J. Gønnes, A. Olsen and H. Matsuhata: J. Electron Microsc. Tech., 13 (1989), 98.

5. 5) Y. Tomokiyo: J. Electron Microsc., 91 (1992), 403.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Measurement of local changes in oxygen concentration of YBa2Cu3Oy using electron diffraction;Physica C: Superconductivity;2000-09

2. Recent Development in Quantitative Electron Diffraction for Crystallography of Materials;Materials Transactions, JIM;1998