Recent Development in Quantitative Electron Diffraction for Crystallography of Materials-Reference-Cited by-同舟云学术

Recent Development in Quantitative Electron Diffraction for Crystallography of Materials

Published:1998 Issue:9 Volume:39 Page:927-937
ISSN:0916-1821
Container-title:Materials Transactions, JIM
language:en
Short-container-title:Mater. Trans., JIM

Author:

Tomokiyo Yoshitsugu¹,Matsumura Syo²

Affiliation:

1. Department of Materials Science and Engineering, Faculty of Engineering, Kyushu University

2. Department of Nuclear Engineering, Faculty of Engineering, Kyushu University

Publisher

Japan Institute of Metals

Subject

General Engineering

Link

https://www.jstage.jst.go.jp/article/matertrans1989/39/9/39_9_927/_pdf

Reference51 articles.

1. 1) P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley and M. J. Whelan: Electron Microscopy of Thin Crystals, Robert E. Krieger, New York, (1977).

2. 2) Y. Tomokiyo: J. Electron Microsc., 41 (1992), 403.

3. 3) M. Tanaka and M. Terauchi: Convergent-Beam Electron Diffraction, JEOL-Maruzen, Tokyo, (1985).

4. 4) M. Tanaka, M. Terauchi and T. Kaneyama: Convergent-Beam Electron Diffraction II, JEOL-Maruzen, Tokyo, (1988).

5. 5) J. C. H. Spence and J. M. Zuo: Electron Microdiffraction, Plenum Press, New York, (1992).

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