Methods for the Quantitative Structural Analysis of Amorphous Ge Thin Film by X-rays
Author:
Affiliation:
1. Research Institute of Mineral Dressing and Metallurgy (SENKEN), Tohoku University
2. Sumitomo Electric Industries LTD.
Publisher
Japan Institute of Metals
Subject
General Engineering
Link
https://www.jstage.jst.go.jp/article/matertrans1960/29/1/29_1_1/_pdf
Reference15 articles.
1. 1) J. F. Graczyk: Magnetism and Magnetic Materials, AIP Conference Proceedings, No. 34 (1976), p. 343.
2. 2) J. F. Graczyk: J. Appl. Phys., 49 (1978), 1738.
3. 3) P. Chaudhari, J. F. Graczyk and S. R. Herd: Phys. Status Solidi (b), 51 (1972), 801.
4. 4) J. F. Graczyk and P. Chaudhari: Phys. Status Solidi, (b), 58 (1973), 163.
5. 5) W. E. Lukens and C. N. J. Wagner: J. Appl. Cryst., 9 (1976), 159.
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