An Electron Microscope Investigation of the Structure of Some Amorphous Materials
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference20 articles.
1. X-Ray Diffraction, Addison-Wesley, Reading (Mass.) 1969.
2. Evidence of Voids Within the As-Deposited Structure of Glassy Silicon
3. THE ATOMIC ARRANGEMENT IN GLASS
4. Structural model for amorphous silicon and germanium
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