Whisker Mitigation Effects and Their Mechanisms of Sn-Based Alloy Finishes

Author:

Nishimura Asao,Nakamura Masato

Publisher

Japan Institute of Electronics Packaging

Subject

Electrical and Electronic Engineering

Reference34 articles.

1. 1) G. T. Galyon: “Annotated Tin Whisker Bibliography and Anthology,” IEEE Trans. Electron. Packag. Manuf., Vol. 28, No. 1, pp. 94–122, 2005

2. 2) S. M. Arnold: “Repressing the Growth of Tin Whiskers,” Plating, Vol. 53, No. 1, pp. 96–99, 1966

3. 4) V. K. Glazunova and N. T. Kudryavtsev: “An Investigation of the Conditions of Spontaneous Growth of Filiform Crystals on Electrolytic Coatings,” Zhurnal Prikladnoi Khimii, Vol. 36, No. 3, pp. 543–550, 1963

4. 5) I. Yanada: “Electroplating of Lead-Free Solder Alloys Composed of Sn–Bi and Sn–Ag,” IPC Printed Circuits Expo 1998, pp. S11-2-1–S11-2-7, 1998

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. On Sn Whisker Suppressing Mechanism by Heat Treatment to the Double Layrer Plating System(Sn/Cu);Journal of the Japan Institute of Metals and Materials;2018

2. Properties and Whisker Formation Behavior of Tin-Based Alloy Finishes;Mitigating Tin Whisker Risks;2016-04-29

3. Sn Plating to Replace Sn-Pb Plating;Journal of the Surface Finishing Society of Japan;2015

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