Dielectric and Electromechanical Behaviors of PMN—PT Ceramic Samples

Abstract

The results of the investigations on (1 — x)PMN-xPT ceramic samples obtained by sol—gel (SG) technology are presented in this study. In the (1 — x)PMN-xPT samples, the temperature Tm (at which real part of dielectric permittivity reaches its maximum) increases from ~270 K for x = 0 to ~500 K for x = 0.5. At room temperature, the samples with low values of x exhibit relaxor properties, while with increasing x the transition to normal ferroelectric properties takes place. Usually 0.9PMN-0.1PT or 0.925PMN-0.075PT solid solutions are considered as boundary compositions between relaxor and ferroelectric properties at room temperature.This study presents the analysis of X-ray diffraction patterns, fracture microphotographs, electromechanical parameters, and hysteresis loops for ceramics obtained from SG PMN—PT powders densified by the hot pressing method with a composition range, x = 0—0.37.