Rapid fault cause identification in surface mount technology processes based on factory-wide data analysis-Reference-Cited by-同舟云学术

Rapid fault cause identification in surface mount technology processes based on factory-wide data analysis

Author:

Kim Dongil¹,Koo Jeongin²,Kim Hyein²,Kang Seokho³^ORCID,Lee Sang Hyun⁴,Kang Jeong Tae⁴

Affiliation:

1. Department of Computer Science and Engineering, Chungnam National University, Daejeon, Republic of Korea

2. Smart Manufacturing Technology Group, Korea Institute of Industrial Technology, Cheonan, Republic of Korea

3. Department of Systems Management Engineering, Sungkyunkwan University, Suwon, Republic of Korea

4. Information Technology Solution Division, Yura Co., Ltd., Seongnam, Republic of Korea

Funder

ministry of trade, industry and energy

Yura Co., Ltd.

Chungnam National University

Korea Institute of Industrial Technology

Publisher

SAGE Publications

Subject

Computer Networks and Communications,General Engineering

Link

Reference32 articles.

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