Affiliation:
1. Software Department, Lviv Polytechnic National University, 12 Stepan Bandera St., Lviv, 79013, UKRAINE
Abstract
The basis of the approach is a scanning procedure with the movement of windows on the printed circuit board to detect defects of various types. Mathematical image comparison, pixel distribution histograms, padding algorithms, statistical calculations, and histogram deviation measurements are applied to the small parts of the PCB image in a small window area. The paper considers K-mean clustering of pixel intensities to simplify the printed circuit board image, separation of elements on the printed circuit board image by filling with colors, determination of defect intensity, and subtraction formulas.
Publisher
World Scientific and Engineering Academy and Society (WSEAS)