1. 1. Nikiforov, S. Temperature in the Life and Operation of Light Emitting Diodes. Part I [Temperatura v zhizni i rabote svetodiodov. Chast I] // Komponenty i tekhnologii., 2005, Vol. 9, pp. 140–146.
2. 2. Chhajed, S., Xi, Y., Gessmann, Th., X, i J.-Q., Shah, J.M., Kim, J.K., Shubert, E.F. et. al. Junction temperature in light-emitting diodes assessed by different methods // Proc., 2005, Vol. 5739 (Light-Emitting Diodes: Research, Manufacturing and Applications IX). Event: Integrated Optoelectronic Devices 2005, 2005, San Jose, California, United States.
3. 3. Xi, Y., Xi, J.-Q., Gessmann, Т., Shah, J.М., Кim, J.К., Schubert, Е.F., Fische, r А.J., Crawford, М.Н., Bogart, К.Н.А., Allerman, А.А. Junction temperature measurements in deep-UV light-emitting diodesю // Appl. Phys. Lett., 2005, Vol. 86, # 031907.
4. 4. Goncharova, Yu.S., Garipov, I.F., Soldatkin, V.S. Accelerated Durability Tests of Semiconductor Light Sources [Uskorennyye ispytaniya poluprovodnikovykh istochnikov sveta na dolgovechnost] // TUSUR University Proceedings, 2013, Vol. 2, # 28, pp. 51–53.
5. 5. Dokhturov, V.V., Smirnov, S.V. Crystal Heat Mode Control in LED Lamps [Kontrol teplovogo rezhima kristallov v svetodiodnykh lampakh] // Poluprovodnikovaya svetotekhnika, 2012, Vol. 5, pp. 37–39.