Laser Voltage Probing of Integrated Circuits: Implementation and Impact-Reference-Cited by-同舟云学术

Laser Voltage Probing of Integrated Circuits: Implementation and Impact

Published:2019 Issue: Volume: Page:244-261
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Container-title:Microelectronics Failure Analysis
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Author:

Serrels Keith A.,Ganesh Ulrike

Publisher

ASM International

Reference54 articles.

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2. Heinrich Harley K., “A Noninvasive Optical Probe for Detecting Electrical Signals in Silicon Integrated Circuits”, Ph.D. Dissertation, Stanford University, California (1987)10.1007/978-1-4613-0979-6_34

3. Noninvasive Optical Sheet Charge Density Probe for Silicon Integrated Circuits;Heinrich;IEEE Trans. Electron Devices,1987

4. Kindereit Ulrike, “Investigation of Laser-Beam Modulations Induced by the Operation of Electronic Devices”, Ph.D. Dissertation, Technical University of Berlin, Germany (2009)

5. Quantitative Investigation of Laser Beam Modulation in Electrically Active Devices as Used in Laser Voltage Probing;Kindereit;IEEE Trans. Device and Mat. Rel.,2007

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