Improved Magnetic Tunnel Junctions Design for the Detection of Superficial Defects by Eddy Currents Testing-Reference-Cited by-同舟云学术

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Improved Magnetic Tunnel Junctions Design for the Detection of Superficial Defects by Eddy Currents Testing

Published:2014-11 Issue:11 Volume:50 Page:1-4
ISSN:0018-9464
Container-title:IEEE Transactions on Magnetics
language:
Short-container-title:IEEE Trans. Magn.

Author:

Cardoso Filipe A.^ORCID,Rosado Luis S.,Franco Fernando,Ferreira Ricardo,Paz Elvira,Cardoso Susana F.,Ramos Pedro M.,Piedade Moises,Freitas Paulo J. P.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/20/6971254/06971594.pdf?arnumber=6971594

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Progress and comparison in nondestructive detection, imaging and recognition technology for defects of wafers, chips and solder joints;Nondestructive Testing and Evaluation;2023-12-08

2. Neural Networks for Defect Detection on Eddy-Currents-Based Non-Destructive Testing;2023 IEEE SENSORS;2023-10-29

3. Magnetic Imaging of Thimble Tube Using Integrated Array TMR Sensors;2023 IEEE SENSORS;2023-10-29

4. Pulsed Magnetic Flux Leakage Measurement Using Magnetic Head and Tunneling Magnetoresistance for Defect Detection;IEEE Sensors Journal;2023-09-01

5. Review of conventional and advanced non-destructive testing techniques for detection and characterization of small-scale defects;Progress in Materials Science;2023-09

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